Optical characterization and selective addressing of the resonant modes of a micropillar cavity with a white light beam

Type:
Peer-reviewed article
Authors:
G. Ctistis, A. Hartsuiker, E. van der Pol, J. Claudon, W. L. Vos, and J.M. Gérard
Date:
Published November 29, 2010
Journal:
Physical Review B
Volume:
82
Issue:
19
Pagination:
195330: 1-7
DOI:
10.1103/PhysRevB.82.195330
Attachment: 
Ctistis 2010 Phys.Rev.B. Micropillar cavity.pdf (413 kB)

Abstract

We have performed white light reflectivity measurements on GaAs/AlAs micropillar cavities with diameters ranging from 1 μm up to 20 μm. We are able to resolve the spatial field distribution of each cavity mode in real space by scanning a small-sized beam across the top facet of each micropillar. We spectrally resolve distinct transverse-optical cavity modes in reflectivity. Using this procedure we can selectively address a single mode in the multimode micropillar cavity. Calculations for the coupling efficiency of a small-diameter beam to each mode are in very good agreement with our reflectivity measurements.

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